ciqtek-sem3200ciqtek-sem3200

Scanning Electron Microscope
SEM3200

The CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent image quality, low vacuum mode compatibility, high-resolution images in different fields of view. The depth of field is large and the image is rich in stereo.

Extensive Scalability

SE\BSE\EDS\EBSD, etc

Optical Navigation

Quickly locate target samples and areas of interest

*Large-Scale Image Stitching

Fully automatic map picking and stitching to display a large field of view

Image Blending (SE+BSE)

Observe the composition and surface information of a sample in one image

Double Anode Structure

Improved resolution and imaging quality at low voltages

*Low Vacuum Mode

Provide sample surface details and morphology in low vacuum, software switch vacuum state with one click

(*Optional accessories)

Features(*Optional accessories)

(*Optional accessories)

 Low Voltage

Carbon material samples with small penetration depth at low voltage. The real shape of the sample surface can be obtained with richer details.

Low Voltage-CarbonHigh Voltage-Carbon

The electron beam irradiation damage of the hair sample is reduced at low voltage while the charge effect is eliminated.

Low Voltage-HairHigh Voltage-Hair

 Low Vacuum

Filtered fiber tube materials are poorly conductive and charge significantly in high vacuum. In the low vacuum, direct observation of non-conductive samples can be achieved without coating.

Low VacuumHigh Vacuum

 Large Field of View

Biological samples, using a large field of view observation, can easily obtain the overall morphology and head structure details of ladybugs, showing cross-scale analysis.

 Navigation & Anti-collision

Optical Navigation

Click where you want to see and navigate more easily
An in-bin camera is standard and can take HD photos to help locate samples quickly.

Optical Navigation
Quick Gesture Navigation

Quick navigation by double-clicking to move, middle mouse button to drag, and frame to zoom
Exp: Frame Zoom - to get a large view of the sample with low magnification navigation, you can quickly frame the sample area you are interested in to improve efficiency.

Quick Gesture NavigationQuick Gesture Navigation
Anti-collision

Adopt a multidimensional anti-collision solution.
1.Manually input sample height: precisely control the distance between the sample and the objective.
2. Image recognition and motion capture: monitor the real-time image.
3.*Hardware: stop the motor at the moment of collision.

Anti-collision

 Specials

Intelligent Assisted Dispersion

Visually reflect the degree of dispersion of the entire field of view, and quickly adjust the dispersion to the best by clicking on the clear spot with the mouse.

Intelligent Assisted DispersionIntelligent Assisted Dispersion
Auto Focus

One-button focus for fast imaging.

Auto FocusAuto Focus
Automatic Dissipation

One-click dissipation to improve work efficiency.

Automatic DissipationAutomatic Dissipation
Auto Brightness Contrast

One-click auto brightness contrast to tune grayscale appropriate images.

Auto Brightness ContrastAuto Brightness Contrast
Simultaneous Imaging of Multiple Information

The software of SEM3200 supports one-click switching between SE and BSE for mixed imaging. Both morphological and compositional information of the sample can be observed at the same time.

Simultaneous Imaging of Multiple InformationBSESimultaneous Imaging of Multiple InformationSE
Simultaneous Imaging of Multiple InformationBSE+SE
Fast Image Rotation Adjustment

Drag a line to adjust position.

Fast Image Rotation AdjustmentFast Image Rotation Adjustment

 Scalability

The scanning electron microscope (SEM) is used not only for the observation of surface morphology but also for the analysis of the composition of micro-regions on the sample surface.
The CIQTEK SEM3200 has a large sample chamber with an extensive interface. In addition to supporting conventional Everhart–Thornley detector (ETD), Backscattered-Electron detector (BSE), and Energy-dispersive X-ray spectroscopy (EDS), various interfaces such as electron backscattered diffractometers (EBSD) and Cathodoluminescence (CL) are also reserved.

Backscattered-Electron Detector (BSE)
Comparison of secondary electron imaging and backscattered electron imaging

In the backscattered electron imaging mode, the charge effect is significantly reduced and more information on the composition of the sample surface can be obtained.

Plating Samples:

Plating SamplesSEPlating SamplesSE

Tungsten Steel Alloy Samples:

Tungsten Steel Alloy SamplesSETungsten Steel Alloy SamplesBSE
Four-segment Backscattered Electron Detector - Multichannel Imaging

The detector has a compact design and high sensitivity. With the 4-segmentation design, it is possible to obtain shadow images in different directions as well as composition distribution images without tilting the sample.

Four Single-channel Images

Component Images

Energy Spectrum

LED small bead energy spectrum analysis results.

Electron Backscatter Diffraction (EBSD)

The tungsten filament electron microscope with a large beam current fully meets the testing requirements of high-resolution EBSD and is capable of analyzing polycrystalline materials such as metals, ceramics, and minerals for crystal orientation calibration and grain size.
The figure shows the EBSD antipodal map of Ni metal specimen, which can identify grain size and orientation, determine grain boundaries and twins, and make accurate judgments on material organization and structure.

Features

(*Optional accessories)

 Low Voltage

Carbon material samples with small penetration depth at low voltage. The real shape of the sample surface can be obtained with richer details.

Low Voltage-CarbonHigh Voltage-Carbon

The electron beam irradiation damage of the hair sample is reduced at low voltage while the charge effect is eliminated.

Low Voltage-HairHigh Voltage-Hair

 Low Vacuum

Filtered fiber tube materials are poorly conductive and charge significantly in high vacuum. In the low vacuum, direct observation of non-conductive samples can be achieved without coating.

Low VacuumHigh Vacuum

 Large Field of View

Biological samples, using a large field of view observation, can easily obtain the overall morphology and head structure details of ladybugs, showing cross-scale analysis.

 Navigation & Anti-collision

Optical Navigation

Click where you want to see and navigate more easily
An in-bin camera is standard and can take HD photos to help locate samples quickly.

Optical Navigation
Quick Gesture Navigation

Quick navigation by double-clicking to move, middle mouse button to drag, and frame to zoom
Exp: Frame Zoom - to get a large view of the sample with low magnification navigation, you can quickly frame the sample area you are interested in to improve efficiency.

Quick Gesture NavigationQuick Gesture Navigation
Anti-collision

Adopt a multidimensional anti-collision solution.
1.Manually input sample height: precisely control the distance between the sample and the objective.
2. Image recognition and motion capture: monitor the real-time image.
3.*Hardware: stop the motor at the moment of collision.

Anti-collision

 Specials

Specials

Visually reflect the degree of dispersion of the entire field of view, and quickly adjust the dispersion to the best by clicking on the clear spot with the mouse.

Intelligent Assisted DispersionIntelligent Assisted Dispersion
Auto Focus

One-button focus for fast imaging.

Auto FocusAuto Focus
Automatic Dissipation

One-click dissipation to improve work efficiency.

Automatic DissipationAutomatic Dissipation
Auto Brightness Contrast

One-click auto brightness contrast to tune grayscale appropriate images.

Auto Brightness ContrastAuto Brightness Contrast
Simultaneous Imaging of Multiple Information

The software of SEM3200 supports one-click switching between SE and BSE for mixed imaging. Both morphological and compositional information of the sample can be observed at the same time.

Simultaneous Imaging of Multiple InformationBSE Simultaneous Imaging of Multiple InformationSE
Simultaneous Imaging of Multiple InformationBSE+SE
Fast Image Rotation Adjustment

Drag a line to adjust position.

Fast Image Rotation AdjustmentFast Image Rotation Adjustment

 Scalability

The scanning electron microscope (SEM) is used not only for the observation of surface morphology but also for the analysis of the composition of micro-regions on the sample surface.
The CIQTEK SEM3200 has a large sample chamber with an extensive interface. In addition to supporting conventional Everhart–Thornley detector (ETD), Backscattered-Electron detector (BSE), and Energy-dispersive X-ray spectroscopy (EDS), various interfaces such as electron backscattered diffractometers (EBSD) and Cathodoluminescence (CL) are also reserved.

Backscattered-Electron Detector (BSE)
Comparison of secondary electron imaging and backscattered electron imaging

In the backscattered electron imaging mode, the charge effect is significantly reduced and more information on the composition of the sample surface can be obtained.

Plating Samples:

Plating SamplesSEPlating SamplesSE

Tungsten Steel Alloy Samples:

Tungsten Steel Alloy SamplesSETungsten Steel Alloy SamplesBSE
Four-segment Backscattered Electron Detector - Multichannel Imaging

The detector has a compact design and high sensitivity. With the 4-segmentation design, it is possible to obtain shadow images in different directions as well as composition distribution images without tilting the sample.

Four Single-channel Images

Component Images

Energy Spectrum

LED small bead energy spectrum analysis results.

Electron Backscatter Diffraction (EBSD)

The tungsten filament electron microscope with a large beam current fully meets the testing requirements of high-resolution EBSD and is capable of analyzing polycrystalline materials such as metals, ceramics, and minerals for crystal orientation calibration and grain size.
The figure shows the EBSD antipodal map of Ni metal specimen, which can identify grain size and orientation, determine grain boundaries and twins, and make accurate judgments on material organization and structure.

EBSD

 

Applications

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Parameters


 
Models SEM3200A SEM3200
Electro-Optical Systems Electron Gun Pre-aligned medium-sized fork-type tungsten filament
Resolution High Vaccum 3 nm @ 30 kV (SE)
4 nm @ 30 kV (BSE)
8 nm @ 3 kV (SE)
*Low Vaccum 3 nm @ 30 kV (SE)
Magnification 1-300,000x (Film Magnification)
1-1000,000x (Screen Magnification)
Acceleration Voltage 0.2 kV ~ 30 kV
Imaging Systems Detector Secondary Electron Detector (ETD)
Backscattered electron detector (BSED), low vacuum secondary electron detector, *energy spectrometer EDS, etc.
Image Format TIFF, JPG, PNG
Vacuum System Vacuum Model High Vacuum Better than 5×10-4 Pa
Low Vacuum 5 ~ 1000 Pa
Control Mode Automatic Valve
Turbomolecular Pump ≥ 240 L/S
Mechanical Pump 200 L/min (50 Hz)
Sample Chamber Camera Optical Navigation
Monitoring in the Sample Chamber
Sample Stage Configuration Three Axis Automatic Five Axis Automatic
Distance X: 120 mm X: 120 mm
Y: 115 mm Y: 115 mm
Z: 50 mm Z: 50 mm
/ R: 360°
/ T: -10° ~ +90°
Software Operating System Windows
Navigations Optical Navigation, Gesture Quick Navigation
Automatic Functions Auto Brightness Contrast, Auto Focus, Automatic Dissipation
Special Functions Intelligent Assisted Dispersion, *Large-Scale Image Stitching (Optional accessories)
Installation Requirements Space L≥ 3000 mm, W ≥ 4000 mm, H ≥ 2300 mm
Temperature 20°C (68°F) ~ 25°C (77°F)
Humidity ≤ 50 %
Power Supply AC 220 V(±10 %), 50 Hz, 2 kVA
ciqtek-sem3200

Parameters

Electro-Optical Systems
Electron Gun
Pre-aligned medium-sized fork-type tungsten filament
Resolution (High Vaccum)
3 nm @ 30 kV (SE)
4 nm @ 30 kV (BSE)
8 nm @ 3 kV (SE)
Resolution (*Low Vaccum)
3 nm @ 30 kV (SE)
Magnification
1~300,000x (Film Magnification)
1~1000,000x (Screen Magnification)
Acceleration Voltage
0.2 kV ~ 30 kV
Imaging Systems
Detectors
Secondary Electron Detector (ETD)
Backscattered electron detector (BSED), low vacuum secondary electron detector, *energy spectrometer EDS, etc.
Image Format
TIFF, JPG, PNG
Vacuum System
High Vacuum
Better than 5×10-4 Pa
*Low Vacuum
5 ~ 1000 Pa
Control Mode
Automatic Valve
Turbomolecular Pump
≥ 240 L/S
Mechanical Pump
200 L/min (50 Hz)
Sample Chamber SEM3200A
Camera
Optical Navigation
Monitoring in the Sample Chamber
Sample Stage Configuration
Three Axis Automatic
Distance
X: 120 mm
Y: 115 mm
Z: 50 mm
/
/
Sample Chamber SEM3200
Camera
Optical Navigation
Monitoring in the Sample Chamber
Sample Stage Configuration
Five Axis Automatic
Distance
X: 120 mm
Y: 115 mm
Z: 50 mm
R: 360°
T: -10°~ +90°
Software
Operating System
Windows
Navigation
Optical Navigation, Gesture Quick Navigation
Automatic Functions
Auto Brightness Contrast, Auto Focus, Automatic Dissipation
Special Functions
Intelligent Assisted Dispersion, *Large-Scale Image Stitching (Optional accessories)
Installation Requirements
Space
L≥ 3000 mm, W ≥ 4000 mm, H ≥ 2300 mm
Temperature
20°C (68°F) ~ 25°C (77°F)
Humidity
≤ 50 %
Power Supply
AC 220 V(±10 %),50 Hz,2 kVA
ciqtek-sem3200
   

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