CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope. It has excellent image quality, low vacuum mode compatibility, high-resolution images in different fields of view. The depth of field is large and the image is rich in stereo.
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SE\BSE\EDS\EDX\EBSD, etc
Quickly locate target samples and areas of interest
Fully automatic map picking and stitching to display a large field of view
Observe the composition and surface information of a sample in one image
Improved resolution and imaging quality at low voltages
Provide sample surface details and morphology in low vacuum, software switch vacuum state with one click
(*Optional accessories)
(*Optional accessories)
Carbon material samples with small penetration depth at low voltage. The real shape of the sample surface can be obtained with richer details.
The electron beam irradiation damage of the hair sample is reduced at low voltage while the charge effect is eliminated.
Filtered fiber tube materials are poorly conductive and charge significantly in high vacuum. In the low vacuum, direct observation of non-conductive samples can be achieved without coating.
Biological samples, using a large field of view observation, can easily obtain the overall morphology and head structure details of ladybugs, showing cross-scale analysis.
Click where you want to see and navigate more easily
An in-bin camera is standard and can take HD photos to help locate samples quickly.
Quick navigation by double-clicking to move, middle mouse button to drag, and frame to zoom
Exp: Frame Zoom - to get a large view of the sample with low magnification navigation, you can quickly frame the sample area you are interested in to improve efficiency.
Adopt a multidimensional anti-collision solution.
1.Manually input sample height: precisely control the distance between the sample and the objective.
2. Image recognition and motion capture: monitor the real-time image.
3.*Hardware: stop the motor at the moment of collision.
Visually reflect the degree of dispersion of the entire field of view, and quickly adjust the dispersion to the best by clicking on the clear spot with the mouse.
One-button focus for fast imaging.
One-click dissipation to improve work efficiency.
One-click auto brightness contrast to tune grayscale appropriate images.
The software of SEM3200 supports one-click switching between SE and BSE for mixed imaging. Both morphological and compositional information of the sample can be observed at the same time.
Drag a line to adjust position.
The scanning electron microscope (SEM) is used not only for the observation of surface morphology but also for the analysis of the composition of micro-regions on the sample surface.
The CIQTEK SEM3200 has a large sample chamber with an extensive interface. In addition to supporting conventional Everhart–Thornley detector (ETD), Backscattered-Electron detector (BSE), and Energy-dispersive X-ray spectroscopy (EDS/EDX), various interfaces such as electron backscattered diffractometers (EBSD) and Cathodoluminescence (CL) are also reserved.
In the backscattered electron imaging mode, the charge effect is significantly reduced and more information on the composition of the sample surface can be obtained.
Plating Samples:
Tungsten Steel Alloy Samples:
The detector has a compact design and high sensitivity. With the 4-segmentation design, it is possible to obtain shadow images in different directions as well as composition distribution images without tilting the sample.
Four 1-channel Images
Component Images
LED small bead energy spectrum analysis results. 
The tungsten filament electron microscope with a large beam current fully meets the testing requirements of high-resolution EBSD and is capable of analyzing polycrystalline materials such as metals, ceramics, and minerals for crystal orientation calibration and grain size.
The figure shows the EBSD antipodal map of Ni metal specimen, which can identify grain size and orientation, determine grain boundaries and twins, and make accurate judgments on material organization and structure.
（*Optional accessories）
Carbon material samples with small penetration depth at low voltage. The real shape of the sample surface can be obtained with richer details.
The electron beam irradiation damage of the hair sample is reduced at low voltage while the charge effect is eliminated.
Filtered fiber tube materials are poorly conductive and charge significantly in high vacuum. In the low vacuum, direct observation of non-conductive samples can be achieved without coating.
Biological samples, using a large field of view observation, can easily obtain the overall morphology and head structure details of ladybugs, showing cross-scale analysis.
Click where you want to see and navigate more easily
An in-bin camera is standard and can take HD photos to help locate samples quickly.
Quick navigation by double-clicking to move, middle mouse button to drag, and frame to zoom
Exp: Frame Zoom - to get a large view of the sample with low magnification navigation, you can quickly frame the sample area you are interested in to improve efficiency.
Adopt a multidimensional anti-collision solution.
1.Manually input sample height: precisely control the distance between the sample and the objective.
2. Image recognition and motion capture: monitor the real-time image.
3.*Hardware: stop the motor at the moment of collision.
Visually reflect the degree of dispersion of the entire field of view, and quickly adjust the dispersion to the best by clicking on the clear spot with the mouse.
One-button focus for fast imaging.
One-click dissipation to improve work efficiency.
One-click auto brightness contrast to tune grayscale appropriate images.
The software of SEM3200 supports one-click switching between SE and BSE for mixed imaging. Both morphological and compositional information of the sample can be observed at the same time.
Drag a line to adjust position.
The scanning electron microscope (SEM) is used not only for the observation of surface morphology but also for the analysis of the composition of micro-regions on the sample surface.
The CIQTEK SEM3200 has a large sample chamber with an extensive interface. In addition to supporting conventional Everhart–Thornley detector (ETD), Backscattered-Electron detector (BSE), and Energy-dispersive X-ray spectroscopy (EDS), various interfaces such as electron backscattered diffractometers (EBSD) and Cathodoluminescence (CL) are also reserved.
In the backscattered electron imaging mode, the charge effect is significantly reduced and more information on the composition of the sample surface can be obtained.
Plating Samples:
Tungsten Steel Alloy Samples:
The detector has a compact design and high sensitivity. With the 4-segmentation design, it is possible to obtain shadow images in different directions as well as composition distribution images without tilting the sample.
Four 1-channel Images
Component Images
LED small bead energy spectrum analysis results.
The tungsten filament electron microscope with a large beam current fully meets the testing requirements of high-resolution EBSD and is capable of analyzing polycrystalline materials such as metals, ceramics, and minerals for crystal orientation calibration and grain size.
The figure shows the EBSD antipodal map of Ni metal specimen, which can identify grain size and orientation, determine grain boundaries and twins, and make accurate judgments on material organization and structure.
Click to Request A Personalized Demo: send us your own samples for SEMs analysis – or choose from one of our many in-house samples.
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| Models | SEM3200A | SEM3200 | ||
|---|---|---|---|---|
| Electro-Optical Systems | Electron Gun | Pre-aligned medium-sized fork-type tungsten filament | ||
| Resolution | High Vaccum | 3 nm @ 30 kV (SE) | ||
| 4 nm @ 30 kV (BSE) | ||||
| 8 nm @ 3 kV (SE) | ||||
| *Low Vaccum | 3 nm @ 30 kV (SE) | |||
| Magnification | 1-300,000x (Film Magnification) | |||
| 1-1000,000x (Screen Magnification) | ||||
| Acceleration Voltage | 0.2 kV ~ 30 kV | |||
| Probe Current | ≥1.2μA, Real-time display | |||
| Imaging Systems | Detector | Secondary Electron Detector (ETD) | ||
| *Backscattered electron detector (BSED), *low vacuum secondary electron detector, *energy spectrometer EDS, etc. | ||||
| Image Format | TIFF, JPG, BMP, PNG | |||
| Vacuum System | Vacuum Model | High Vacuum | Better than 5×10-4 Pa | |
| Low Vacuum | 5 ~ 1000 Pa | |||
| Control Mode | Fully automatic control | |||
| Sample Chamber | Camera | Optical Navigation | ||
| Monitoring in the Sample Chamber | ||||
| Sample Table | Three Axis Automatic | Five Axis Automatic | ||
| Distance | X: 120 mm | X: 120 mm | ||
| Y: 115 mm | Y: 115 mm | |||
| Z: 50 mm | Z: 50 mm | |||
| / | R: 360° | |||
| / | T: -10° ~ +90° | |||
| Software | Operating System | Windows | ||
| Navigations | Optical Navigation, Gesture Quick Navigation | |||
| Automatic Functions | Auto Brightness Contrast, Auto Focus, Automatic Dissipation | |||
| Special Functions | Intelligent Assisted Dispersion, *Large-Scale Image Stitching (Optional accessories) | |||
| Installation Requirements | Space | L≥ 3000 mm, W ≥ 4000 mm, H ≥ 2300 mm |
||
| Temperature | 20°C (68°F) ~ 25°C (77°F) | |||
| Humidity | ≤ 50 % | |||
| Power Supply | AC 220 V(±10 %), 50 Hz, 2 kVA | |||
