The CIQTEK SEM2000 is a basic and versatile analytical tungsten filament scanning electron microscope with 20 kV resolution up to 3.9 nm and support for upgrading to 30 kV, allowing observation of microstructural information of sub-microscale samples.
It has a larger range of motion than a desktop / benchtop SEM and is suitable for rapid screening of samples, and has more expansion interfaces for BSED, EDS/EDX, and other accessories to enable a wider range of applications.
*Software interface for reference only
Clear and Simple Interface
The features are simple and easy to operate. Even beginners can get started quickly after the quick learning.
Advanced Automation Features
Auto brightness contrast, autofocus, and auto image dispersion are all adjustable with one click.
Extensive Measurement Functions
Photo management, preview, and editing functions with measurement functions such as length, area, roundness, and angle.
Optical Navigation
Easy to navigate by clicking where you want to see.
Standard optical navigation camera for high-definition sample stage photos and quick sample positioning.
Anti-collision
More novice-friendly anti-collision design for maximum protection of sensitive units.
One-Click Imaging
*The software is easy to operate with one-click imaging.
Working Distance
The optimal analysis distance and image distance are two in one to easily experience quality performance.
The software supports one-click switching between SE and BSE for hybrid imaging. Both morphological and compositional information of the sample can be observed at the same time.
SE: 3.9 nm @20 kV
BSE: 4.5 nm @ 20 kV
High-sensitivity Backscatter Detector
· Multi-channel imaging
The detector has a compact design and high sensitivity. With a 4-segmentation design, there is no need to tilt the sample to obtain shadow images in different directions as well as composition distribution images.
Four 1-channel Images
Component Image
· Comparison of secondary electron (SE) imaging and backscattered electron (BSE) imaging
In the backscattered electron imaging mode, the charge effect is significantly diminished and more information on the composition of the sample surface can be obtained.
Iron Ore - (SE)
Iron Ore -(BSE)
Energy Spectrum
Results of surface scan analysis of metal inclusions energy spectrum.
Electron Backscatter Diffraction (EBSD)
The tungsten filament electron microscope with the large beam current fully meets the testing requirements of high-resolution EBSD and is capable of analyzing polycrystalline materials such as metals, ceramics, and minerals for crystal orientation calibration and grain size. The figure shows the EBSD antipodal map of the Ni metal specimen, which can identify grain size and orientation, determine grain boundaries and twins, and make accurate judgments on material organization and structure.
Microstructure of endosperm starch granules of new rice
Acceleration voltage: 10 kV / Magnification: ×5000
Salt
Acceleration voltage: 1 kV / Magnification: ×2000
Fiber cross-section
Acceleration voltage: 7 kV / Magnification: ×1000
Polymer lens arrays
Acceleration voltage: 15 kV / Magnification: ×200
Catalyst-carrying nickel mesh
Acceleration voltage: 20 kV / Magnification: ×200
Ammonium paratungstate
Acceleration voltage: 5 kV / Magnification: ×1000
MnS inclusions
Acceleration voltage: 15 kV / Magnification: ×500
Metal fracture
Acceleration voltage: 20 kV / Magnification: ×200
Negative Electrode - Carbon Coated Silicon
Acceleration voltage: 10 kV / Magnification: ×3000
Dry stretch film
Acceleration voltage: 3 kV / Magnification: ×5000
Lithium iron phosphate
Acceleration voltage: 15 kV / Magnification: ×5000
Lithium Cobaltate
Acceleration voltage: 15 kV / Magnification: ×5000
PCB board
Acceleration voltage: 10 kV / Magnification: ×100
PCB board (headlight)
Acceleration voltage: 10 kV / Magnification: ×100
Copper foil raw foil
Acceleration voltage: 10 kV / Magnification: ×10000
Chips
Acceleration voltage: 15 kV / Magnification: ×500
Red-winged cranesbill pink butterfly
Acceleration voltage: 3 kV / Magnification: ×5000
Mimosa herbal granules
Acceleration voltage: 3 kV / Magnification: ×2000
Mistletoe herbal raw powder
Acceleration voltage: 3 kV / Magnification: ×2000
Schizococcus spp.
Acceleration voltage: 15 kV / Magnification: ×30000
| Electro-Optical Systems | Electron Gun | Pre-aligned medium-sized fork-type tungsten filament |
| Resolution | 3.9 nm @ 20 kV (SE) | |
| 4.5 nm @ 20 kV (BSE) | ||
| Magnification | 1 x～300,000 x | |
| Acceleration Voltage | 0.5 kV ~ 20 kV | |
| Imaging Systems | Detector | Secondary Electron Detector (ETD) |
| *Backscattered electron detector (BSED), *energy spectrometer EDS, etc. | ||
| Image Format | TIFF, JPG, BMP, PNG | |
| Vacuum System | High Vacuum | Better than 5×10-4 Pa |
| Control Mode | Fully automated control system | |
| Pumps | Mechanical Pump ×1, Molecular Pump ×1 | |
| Sample Chamber | Camera | Optical Navigation |
| Sample Table | Two-axis automatic | |
| Distance | X: 100 mm | |
| Y: 100 mm | ||
| Software | Operating System | Windows |
| Navigations | Optical Navigation, Gesture Quick Navigation | |
| Automatic Functions | Auto Brightness Contrast, Auto Focus, Automatic Dissipation | |
| Special Functions | Intelligent Assisted Dispersion, *Large-Scale Image Stitching (Optional accessories) | |
| Installation Requirements | Space | L ≥ 3000 mm, W ≥ 4000 mm, H ≥ 2300 mm |
| Temperature | 20°C (68°F) ~ 25°C (77°F) | |
| Humidity | ≤ 50 % | |
| Power Supply | AC 220 V(±10 %), 50 Hz, 2 kVA |
