ciqtek-sem2000
Tungsten Filament Scanning Electron Microscope
SEM2000
 

The CIQTEK SEM2000 is a basic and versatile analytical tungsten filament scanning electron microscope with 20 kV resolution up to 3.9 nm and support for upgrading to 30 kV, allowing observation of microstructural information of sub-microscale samples.
It has a larger range of motion than a desktop / benchtop SEM and is suitable for rapid screening of samples, and has more expansion interfaces for BSED, EDS/EDX, and other accessories to enable a wider range of applications.

 

Click for a free quote or a personalized demo

Resolution 3.9 nm @ 20 kV
Acceleration Voltage 0.5 ~ 20 kV
(30 kV optional)
Magnification 1 ~ 300,000x
Highlights
Simplified User Interface
sem2000-Software interface for reference only

*Software interface for reference only

Clear and Simple Interface

The features are simple and easy to operate. Even beginners can get started quickly after the quick learning.

Advanced Automation Features

Auto brightness contrast, autofocus, and auto image dispersion are all adjustable with one click.

Extensive Measurement Functions

Photo management, preview, and editing functions with measurement functions such as length, area, roundness, and angle.

Features

Optical Navigation

Easy to navigate by clicking where you want to see.

Standard optical navigation camera for high-definition sample stage photos and quick sample positioning.

sem2000-Optical Navigation

Anti-collision

More novice-friendly anti-collision design for maximum protection of sensitive units.

sem2000-Anti-collision

One-Click Imaging

*The software is easy to operate with one-click imaging.

sem2000-One-Click Imaging

Working Distance

The optimal analysis distance and image distance are two in one to easily experience quality performance.

sem2000-Working Distance
Simultaneous Imaging of Multiple Information
sem2000-Simultaneous Imaging of Multiple Information

The software supports one-click switching between SE and BSE for hybrid imaging. Both morphological and compositional information of the sample can be observed at the same time.

Resolution Indicators

SE: 3.9 nm @20 kV

BSE: 4.5 nm @ 20 kV

Extended Scalability and Functionalities

High-sensitivity Backscatter Detector

· Multi-channel imaging

The detector has a compact design and high sensitivity. With a 4-segmentation design, there is no need to tilt the sample to obtain shadow images in different directions as well as composition distribution images.

 
sem2000-Multi-channel imaging
 
 

Four 1-channel Images

Component Image

 

· Comparison of secondary electron (SE) imaging and backscattered electron (BSE) imaging

In the backscattered electron imaging mode, the charge effect is significantly diminished and more information on the composition of the sample surface can be obtained.

 
sem2000-Comparison of secondary electron (SE) imaging and backscattered electron (BSE) imaging
 
 

Iron Ore - (SE)

Iron Ore -(BSE)

 

Energy Spectrum

Results of surface scan analysis of metal inclusions energy spectrum.

sem2000-Energy Spectrum

Electron Backscatter Diffraction (EBSD)

The tungsten filament electron microscope with the large beam current fully meets the testing requirements of high-resolution EBSD and is capable of analyzing polycrystalline materials such as metals, ceramics, and minerals for crystal orientation calibration and grain size. The figure shows the EBSD antipodal map of the Ni metal specimen, which can identify grain size and orientation, determine grain boundaries and twins, and make accurate judgments on material organization and structure.

sem2000-Electron Backscatter Diffraction (EBSD)
 
Applications
sem2000-Microstructure of endosperm starch granules of new rice

Microstructure of endosperm starch granules of new rice

Acceleration voltage: 10 kV / Magnification: ×5000

sem2000-Salt

Salt

Acceleration voltage: 1 kV / Magnification: ×2000

sem2000-Fiber cross-section

Fiber cross-section

Acceleration voltage: 7 kV / Magnification: ×1000

sem2000-Polymer lens arrays

Polymer lens arrays

Acceleration voltage: 15 kV / Magnification: ×200

sem2000-Catalyst-carrying nickel mesh

Catalyst-carrying nickel mesh

Acceleration voltage: 20 kV / Magnification: ×200

sem2000-Ammonium paratungstate

Ammonium paratungstate

Acceleration voltage: 5 kV / Magnification: ×1000

sem2000-MnS inclusions

MnS inclusions

Acceleration voltage: 15 kV / Magnification: ×500

sem2000-Metal fracture

Metal fracture

Acceleration voltage: 20 kV / Magnification: ×200

sem2000-Negative Electrode - Carbon Coated Silicon

Negative Electrode - Carbon Coated Silicon

Acceleration voltage: 10 kV / Magnification: ×3000

sem2000-Dry stretch film

Dry stretch film

Acceleration voltage: 3 kV / Magnification: ×5000

sem2000-Lithium iron phosphate

Lithium iron phosphate

Acceleration voltage: 15 kV / Magnification: ×5000

sem2000-Lithium Cobaltate

Lithium Cobaltate

Acceleration voltage: 15 kV / Magnification: ×5000

sem2000-PCB board

PCB board

Acceleration voltage: 10 kV / Magnification: ×100

sem2000-PCB board (headlight)

PCB board (headlight)

Acceleration voltage: 10 kV / Magnification: ×100

sem2000-Copper foil raw foil

Copper foil raw foil

Acceleration voltage: 10 kV / Magnification: ×10000

sem2000-Chips

Chips

Acceleration voltage: 15 kV / Magnification: ×500

sem2000-Red-winged cranesbill pink butterfly

Red-winged cranesbill pink butterfly

Acceleration voltage: 3 kV / Magnification: ×5000

sem2000-Mimosa herbal granules

Mimosa herbal granules

Acceleration voltage: 3 kV / Magnification: ×2000

sem2000-Mistletoe herbal raw powder

Mistletoe herbal raw powder

Acceleration voltage: 3 kV / Magnification: ×2000

sem2000-Schizococcus spp.

Schizococcus spp.

Acceleration voltage: 15 kV / Magnification: ×30000

Parameters
Electro-Optical Systems Electron Gun Pre-aligned medium-sized fork-type tungsten filament
Resolution 3.9 nm @ 20 kV (SE)
4.5 nm @ 20 kV (BSE)
Magnification 1 x~300,000 x
Acceleration Voltage 0.5 kV ~ 20 kV
Imaging Systems Detector Secondary Electron Detector (ETD)
*Backscattered electron detector (BSED), *energy spectrometer EDS, etc.
Image Format TIFF, JPG, BMP, PNG
Vacuum System High Vacuum Better than 5×10-4 Pa
Control Mode Fully automated control system
Pumps Mechanical Pump ×1, Molecular Pump ×1
Sample Chamber Camera Optical Navigation
Sample Table Two-axis automatic
Distance X: 100 mm
Y: 100 mm
Software Operating System Windows
Navigations Optical Navigation, Gesture Quick Navigation
Automatic Functions Auto Brightness Contrast, Auto Focus, Automatic Dissipation
Special Functions Intelligent Assisted Dispersion, *Large-Scale Image Stitching (Optional accessories)
Installation Requirements Space L ≥ 3000 mm, W ≥ 4000 mm, H ≥ 2300 mm
Temperature 20°C (68°F) ~ 25°C (77°F)
Humidity ≤ 50 %
Power Supply AC 220 V(±10 %), 50 Hz, 2 kVA
 
sem200-sketch

Contact Us(Shipping Worldwide)

Name
Phone/WhatsApp
Company/Institution
Email
Message