Field Emission Scanning Electron Microscope | SEM4000

Scanning Electron Microscope
SEM4000

CIQTEK SEM4000 is an analytical thermal field emission scanning electron microscope equipped with a high-brightnesslonglife Schottky field emission electron gun.

Three-stagemagnetic lens design, with large and continuously adjustable beam current, has obvious advantages in EDS, EBSD, WDS, and other applications. Support low vacuum mode, can directly observe the conductivity of weak or non-con-ductive samples. Standard optical navigation mode, as well as intuitive operation interface, make your analysis work easy.

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*Low vacuum mode

High resolution (1nm@30kV)

Continuously adjustable beam current

*60 seconds fast sample switch

Three-stage magnetic lens

Leak-free magnetic objective

Product Features

Equipped with high brightness and long life Schottky field emission electron gun

High resolution, better than 1nm resolution at 30 kV

Three-stage magnetic lens design, wide beam adjustable range

*High performance low vacuum secondary electron detectors, observe weak or non-conductive samples

Leak-free magnetic objective design, can directly observe magnetic samples

Standard optical navigation mode

Applications

PA-Glass fiber composite material

10kV ×500 BSED Comp

Silica microspheres

10kV ×80,000 BSED Comp

Metal fracture

15kV ×5,000 SE ETD

Metal microstructure (aluminum copper welding parts)

20kV ×10,000 BSED Comp

Cauliflower pollen

10kV ×50,000 SE ETD

Strontium barium titanate ceramics

10kV ×10,000 BSED Comp

Titanium alloy

10kV ×5,000 BSED Comp

Titanium alloy

10kV ×10,000 SE ETD

Specifications

Key Parameters	Resolution	1 nm @ 30 kV, SE
	Resolution	0.9 nm @ 30 kV, STEM
	Accelerating voltage	200 V ~ 30 kV
	Magnification	1 ~ 1,000,000 x
	Electron gun	High brightness schottky field emission electron gun
Sample room	Vacuum system	Fully automatic control
	Low vacuum (optional)	Max 180Pa
	Camera	Dual cameras (Optical navigation + in-chanmber monitoring)
	Distance	X: 120 mm
		Y: 115 mm
		Z: 50 mm
		T: -10°~ +90°
		R: 360°
Detector and extension	Standard	Everhart-Thornley detector (ETD)
	Optional	Low vacuum detector (LVD)
		Backscattered electron detector (BSE)
		STEM detector
		EDS
		EBSD
		Airlock
		Trackball & Knob control panel
Software	Language	Chinese/English
	OS	Windows
	Navigation	Optical navigation, gesture navigation
	Automatic function	Auto brightness contrast, auto focus, auto astigmatism

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