SEM3100SEM3100

Scanning Electron Microscope
SEM3100


The CIQTEK SEM3100 is a cost-effective tungsten filament scanning electron microscope for the observation of nanoscale microstructures. It has a magnification of up to 300,000x and a resolution better than 3nm and is also equipped with a 370mm diameter sample chamber.

High in Performance and Interoperable

The CIQTEK SEM3100 is a high-performance scanning electron microscope with ultra-high resolution and excellent image quality. The magnification is continuously adjustable, and clear images with high brightness can be obtained in different fields of view. The depth of field is large and the image is rich in stereo. Equipped with a large sample chamber and low voltage mode greatly expands the range of applications.

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Scalability

The scanning electron microscope (SEM) is used not only for the observation of surface morphology but also for the analysis of the composition of micro-regions on the sample surface. The CIQTEK SEM3100 has a large sample chamber with an extensive interface. In addition to supporting conventional secondary electron detectors (SED), backscattered electron detectors (BSED), and X-ray energy dispersive spectrometers (EDS), various interfaces such as electron backscattered diffractometers (EBSD), X-ray wavelength dispersive spectrometers (WDS), and cathodoluminescence spectrometers (CL) are also reserved.

BSED vs SE

In the backscattered image, the sample charged effect is significantly weakened and the composition is a good contrast for compositional observation.

EDS vs SE

Results of SE and EDS analysis of cement building materials with accelerating voltage @ 15 kV.
*The trace Au element is the coating after gold spraying

Characteristics: Higher Efficiency and Better Performance

Optical Navigation

Optical Navigation

An in-bin camera is standard and can take HD photos to help locate samples quickly.

Knob Control Panel and Mouse Gestures

Knob Control Panel n Mouse Gestures

Parameters can be quickly adjusted via the knob control pad or mouse wheel/gesture.

Dynamic AstigmatismDynamic Picture
Dynamic AstigmatismResult Graph

Dynamic Astigmatism

Visualize the degree of dispersion, and quickly adjust the dispersion to the optimal level by mouse click.

Fast Image Rotation AdjustmentDynamic Picture
Fast Image Rotation Adjustment-resultResult Graph

Fast Image Rotation Adjustment

Drag a line to adjust position.

Detailed Design to Ensure Optimal Ease of Use

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Note:
①Optional five-axis sample stage support only. ②Vacuum motor as standard.

CIQTEK SEM3100 Applications

Click for a larger view

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Parameters

Electro-Optical Systems
Resolution
3 nm @ 30 kV, SE
Magnification
1 x ~ 300,000 x
Acceleration Voltage
1 kV~30 kV
Electron Gun
Pre-aligned medium-sized fork-type tungsten filament
Imaging Systems
Detector (Standard)
Secondary Electron Detector (SED)
Detector (Optional)
BSED, EDS, etc
Image Pixel
≤ 6144 x 4096 Pixel
Image Format
TIFF, JPG, BMP, PNG
Sample Stage
Control Method
Automatic Valve
Turbomolecular Pump
240 L/S
Mechanical Pump
12 m³/h(50 Hz)
Camera
Optical Navigation
Monitoring in the Sample Chamber
Vacuum of Sample Chamber
Better than 9 X 10-4 Pa under High Vacuum
Sample Stage Configuration
Three Axis Automatic (Standard)
Five Axis Automatic (Optional)
Distance
X: 100 mm
X: 115 mm
Y: 100 mm
Y: 115 mm
Z: 60 mm
Z: 65 mm
/
R: -180°~ +180°
/
T: -10° to +75°
Max Sample Size
Φ: 370 mm, H: 68 mm
Φ: 370 mm, H: 73 mm
Software
Language
Chinese / English
Operating System
Windows
Navigation
Optical Navigation, Gesture Quick Navigation
Automatic Function
Auto Brightness Contrast, Auto Focus
Special Function
Dynamic Astigmatism
Installation Requirements
Space
L≥ 3000 mm, W ≥ 4000 mm, H ≥ 2300 mm
Door Size
W ≥ 900 mm, H ≥ 2000 mm
Temperature
20 ℃ to 25 ℃
Humidity
≤ 50%
Noise
≤ 45dB
Power Supply
AC 220 V (±10 %), 50 Hz, 2 kVA
Ground Wire
Less than 4 Ω
AC Magnetic Field
Less than 100 nT
产品线稿图

Contact us (Phone: +86-551-62835225)

Address

CIQTEK Hefei : 1-4F, Area A, E2 Building, Innovation Industrial Park II, High-tech District, Hefei, Anhui

CIQTEK Wuxi : No. 2 Zhanqian Road, Huishan Intercity Railway Station, Huishan District, Wuxi

CIQTEK Shanghai : Room 8405,No.315 Emei Road, North Bund, Hongkou District, Shanghai

Contact us

Tel : +86-551-62835225
(Office Hours: Mon-Fri, 9:00-18:00, UTC+8)

Email : info@ciqtek.com

Website : www.ciqtek.com

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