From September 27th to 28th, "China Scanning Probe Microscopy Symposium (SPM2019)" hosted by Anhui General University Key Laboratory of Precision Scientific Instruments, University of Science and Technology of China (USTC) and co-organized by CIQTEK was held in the Expert Building of USTC in Hefei, Anhui, China.
Group Photo of SPM2019
From the 1990s to 2012, the China SPM Symposium has been successfully held for twelve sessions, playing an important role in the progress of science and technology and the development of high-tech industries.
At the opening ceremony of the conference, Vice President Luo Xisheng talked about the development history and status of scanning probe microscopy. He also emphasized the original purpose and importance of this conference, hoping to promote communication and exchange between experts and scholars through this conference, and wished the conference a complete success.
SPM2019 Site
Experts and scholars from well-known universities and research institutions such as Peking University and Chinese University of Hong Kong, as well as many global scanning probe microscope instrument developers, gathered at the USTC to conduct academic exchanges on SPM scientific research results and industrialization development.
The conference provided a platform for academic exchange. The attending experts shared their academic achievements in the field of SPM in recent years and discussed the new trends in the future development of SPM together. During the conference, 14 invited presentations, 17 oral presentations, and 2 enterprise presentations were made by experts and scholars on five topics, including "SPM-related fundamental theories and simulation methods", "SPM instrumentation technology progress", "SPM important applications", "SPM standardization" and "product promotion of domestic and foreign SPM manufacturers".
CIQTEK CEO Dr. Yu He made the report
As a co-organizer of the conference and a developer of scientific instruments related to SPM, Dr. Yu He, CEO of CIQTEK, attended the conference and gave a presentation on "Development and Engineering of Quantum Diamond Atomic Force Microscope".
CIQTEK also brought its Quantum Diamond Atomic Force Microscope to the exhibition site of this conference and made a comprehensive introduction and demonstration to the participants.
Li Bingjiang, director of CIQTEK marketing department, introduced the Quantum Diamond Atomic Force Microscope on site
CIQTEK Quantum Diamond Atomic Force Microscope
CIQTEK QDAFM is a scanning NV center microscope based on diamond nitrogen-vacancy center (NV center) and AFM scanning imaging technology. The magnetic properties of the sample are obtained quantitatively and non-destructively by quantum control and readout of the spin state in the diamond probe. Based on the nv diamond magnetometry and quantum mechanics, QDAFM has nanoscale spatial resolution and ultra-high detection sensitivity and can be used to develop and study magnetic textures, high-density magnetic storage, and spintronics.
There are two versions: ambient version and cryogenic version.
CIQTEK Quantum Diamond Atomic Force Microscope
